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Wei, J. et al. (2022). Abnormal area identification of corn ear based on semi‐supervised learning. IET image processing. 16 (9), pp. 2351-2360. [Online].
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Wei, J. et al. (2022). Abnormal area identification of corn ear based on semi‐supervised learning. IET image processing. 16 (9), pp. 2351-2360. [Online].