Cite
HARVARD Citation
Mou, P. et al. (2021). Exploration of Nafion for the Electric-Double-Layer Gating of Metal-Oxide Thin Film Transistors. ECS journal of solid state science and technology. p. . [Online].
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Mou, P. et al. (2021). Exploration of Nafion for the Electric-Double-Layer Gating of Metal-Oxide Thin Film Transistors. ECS journal of solid state science and technology. p. . [Online].