Longitudinal and transverse spatial beam profile measurement of relativistic electron bunch by electro-optic sampling. (15th January 2021)

• Record Type: Journal Article
• Authors: Ota, Masato; Kan, Koichi; Komada, Soichiro; Arikawa, Yasunobu; Shimizu, Tomoki; Mag-usara, Valynn Katrine; Sakawa, Youichi; Matsui, Tatsunosuke; Nakajima, Makoto
• Is Part Of: Applied physics express. Volume 14:Number 2(2021)
• Publication Date: 2021-01-15
• Subjects: Electro-optic sampling -- Electron beam -- X-ray free-electron laser -- Laser plasma acceleration; Physics -- Periodicals; Technology -- Periodicals; 621.05
• DOI: 10.35848/1882-0786/abd867
• Languages: English
• ISSNs: 1882-0778

Abstract

Abstract: Electro-optic (EO) sampling is employed to measure the electric field profiles generated by a relativistic electron bunch along the propagation and in the radial directions. The longitudinal (temporal) profile is investigated by changing the time delay between the electron bunch and the pulsed probe laser, while the transverse (radial) profile is acquired by laterally shifting the path of the electron bunch. Experimental results show good agreement with three-dimensional particle-in-cell calculations. We demonstrated a promising method to simultaneously obtain the longitudinal and transverse beam sizes by utilizing the detected spatio-temporal electric field distribution around the electron bunch.