Photoelectrochemical activity of magnetron sputtered ZnO thin films: role of thermal annealing. (16th July 2022)

• Record Type: Journal Article
• Authors: Almamari, M.R.; Ahmed, N.M.; Holi, A.M.; Yam, F.K.; Al-Zahrani, A.A.; Almessiere, M.A.
• Is Part Of: International journal of nanotechnology. Volume 19:Number 2/5(2022)
• Page Start: 265
• Page End: 280
• Publication Date: 2022-07-16
• Subjects: RF magnetron sputtering -- ZOTFs -- photoresponse -- photoelectrode -- photoconversion efficiency -- photoelectrochemical performance; 620.505
• Languages: English
• ISSNs: 1475-7435

Abstract

In this paper, the effect of annealing temperature on the properties of ZnO thin films (ZOTFs) obtained using the well-known RF magnetron sputtering technique was investigated using their photoresponse in a photoelectrochemical cell. Properties pertaining to morphology, composition, structure, and optical were examined by field emission scanning electron microscopy (FESEM), energy-dispersive X-ray spectrometer (EDX), X-ray diffraction (XRD), and ultraviolet-visible spectroscopy (UV-vis), respectively. Results from FESEM showed that the surface of the ZOTFs nanoparticles was very compact, with grain size 63.32 nm at 400°C. When compared to other temperatures, 400°C contributes to a wide surface area resulting in a significantly enhanced PEC response. The ZOTF which was prepared under 400°C of annealing temperature, exhibited the highest photocurrent density 0.034 mA cm -2 and photoconversion efficiency (0.026%).