Reliability Prediction Methods for Electronic Devices: A State-of-the-art Review. Issue 2 (4th March 2022)

• Record Type: Journal Article
• Authors: Kumar, Vinay; Singh, Lalit Kumar; Tripathi, Anil Kumar
• Is Part Of: IETE technical review. Volume 39:Issue 2(2022)
• Page Start: 460
• Page End: 470
• Publication Date: 2022-03-04
• Subjects: Empirical based model -- Physics of failure -- Reliability metrics -- Reliability prediction; Telecommunication -- Periodicals; Electronics -- Periodicals; Electronics; Telecommunication; Periodicals; 621.38
• DOI: 10.1080/02564602.2020.1843552
• Languages: English
• ISSNs: 0256-4602

Abstract

Abstract : Today, numerous reliability prediction methods exist for electronic systems. A detailed literature survey is conducted to investigate the various techniques/models to ensure electronic components/system's reliability. Based on such a method's merits and limitations, we recommend using the hybrid model to predict an electronic system's reliability prediction in the distinct development phase of the product life cycle to get higher accuracy.