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HARVARD Citation
Ray, A. et al. (2022). Analysis of total ionizing dose response of optimized fin geometry workfunction modulated SOI-FinFET. Microelectronics and reliability. p. . [Online].
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Ray, A. et al. (2022). Analysis of total ionizing dose response of optimized fin geometry workfunction modulated SOI-FinFET. Microelectronics and reliability. p. . [Online].