Determination of focal spot size of high-energy microfocal X-ray source based on HfO2-coated single-bounce ellipsoidal glass monocapillary X-ray condenser. Issue 1 (February 2020)

• Record Type: Journal Article
• Authors: Wang, Y B; Shao, S K; Zhang, X Y; Li, Y F; Sun, X P; Liu, Z G; Sun, T X
• Is Part Of: IOP conference series. Volume 770:Issue 1(2020)
• Publication Date: 2020-02
• Subjects: Materials science -- Periodicals; 620.1105
• DOI: 10.1088/1757-899X/770/1/012103
• Languages: English
• ISSNs: 1757-8981

Abstract

Abstract: A method based on the single-bounce ellipsoidal monocapillary X-ray condenser (SEGMXC) was improved for determining the focal spot size of the high-energy microfocal X-ray source. HfO2 was selected as the high-density material (∼9.68g/cm3) and coated on the inner surface of the SEGMXC by the atomic layer deposition method. The focal spot size of a microfocal spot X-ray source was obtained as 33.14 ± 0.02 μm and the relative deviation of the effective size given by the manufacturer was 5.3%.