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HARVARD Citation
Liu, Y. et al. (2019). Dielectric relaxation and resistive switching of Bi0.96Sr0.04Fe0.98Co0.02O3/CoFe2O4 thin films with different thicknesses of the Bi0.96Sr0.04Fe0.98Co0.02O3 layer. Ceramics international. 45 (3), pp. 3522-3530. [Online].