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HARVARD Citation
Niherysh, K. et al. (2021). Correlation analysis of vibration modes in physical vapour deposited Bi2Se3 thin films probed by the Raman mapping technique. Nanoscale advances. 3 (22), pp. 6395-6402. [Online].
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Niherysh, K. et al. (2021). Correlation analysis of vibration modes in physical vapour deposited Bi2Se3 thin films probed by the Raman mapping technique. Nanoscale advances. 3 (22), pp. 6395-6402. [Online].