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HARVARD Citation
Agarwal, A. et al. (2022). Analytical characterisation of 3D nano scale ultra-thin film surrounding gate MOSFET. International journal of engineering systems modelling and simulation. pp. 134-139. [Online].
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Agarwal, A. et al. (2022). Analytical characterisation of 3D nano scale ultra-thin film surrounding gate MOSFET. International journal of engineering systems modelling and simulation. pp. 134-139. [Online].