Cite
HARVARD Citation
Shivakumar, V. et al. (2022). Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs. Microelectronics journal. p. . [Online].
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Shivakumar, V. et al. (2022). Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs. Microelectronics journal. p. . [Online].