Cite
HARVARD Citation
Fukui, H. et al. (2022). Connection between micron-sized defects and dielectric strength of poly(dimethylsiloxane) elastomer films. Polymer testing. p. . [Online].
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Fukui, H. et al. (2022). Connection between micron-sized defects and dielectric strength of poly(dimethylsiloxane) elastomer films. Polymer testing. p. . [Online].