Cite
HARVARD Citation
Schoenaers, B. et al. (2020). Analysis of Transferred MoS2 Layers Grown by MOCVD: Evidence of Mo Vacancy Related Defect Formation. ECS journal of solid state science and technology. p. . [Online].
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Schoenaers, B. et al. (2020). Analysis of Transferred MoS2 Layers Grown by MOCVD: Evidence of Mo Vacancy Related Defect Formation. ECS journal of solid state science and technology. p. . [Online].