Structure of Strained Low‐Dimensional Sb by In Situ Surface X‐Ray Diffraction. Issue 4 (27th January 2022)

• Record Type: Journal Article
• Authors: Mousley, Philip J.; Burrows, Christopher W.; Nicklin, Chris; Bell, Gavin R.
• Is Part Of: Physica status solidi. Volume 259:Issue 4(2022)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2022-01-27
• Subjects: antimony -- crystallography -- strains -- surface X-ray diffraction -- topological materials; Solid state physics -- Periodicals; Solids -- Periodicals; Atomic structure -- Periodicals; 530.41
• DOI: 10.1002/pssb.202100432
• Languages: English
• ISSNs: 0370-1972

Abstract

Abstract : Antimony ultrathin films in tensile strain are grown on InAs(111)B substrates and studied in situ using surface X‐ray diffraction. The detailed atomic structures of two highly crystalline Sb(0001) films are derived, with thicknesses of 19 and 4 bilayers. Features considered in structural modeling include interfacial intermixing, surface roughness, individual layer relaxations, and rotational twin domains (RTDs). The four‐bilayer film shows significant structural relaxation in every layer, while both films include RTDs. The results are discussed in relation to the topological properties of low‐dimensional Sb. Abstract : Antimony ultrathin films can display topologically protected surfaces and interface states. In situ surface X‐ray diffraction reveals the detailed atomic structure of pristine 4‐ and 19‐bilayer‐thick Sb(111) films grown on InAs(111). The films are highly crystalline and coherently strained to the substrate. In‐plane strain is a new parameter for controlling topological properties.