Corrosion behavior of immersion silver printed circuit board copper under a thin electrolyte layer. (November 2020)
- Record Type:
- Journal Article
- Title:
- Corrosion behavior of immersion silver printed circuit board copper under a thin electrolyte layer. (November 2020)
- Main Title:
- Corrosion behavior of immersion silver printed circuit board copper under a thin electrolyte layer
- Authors:
- Huang, Hualiang
Guo, Xiaomeng
Bu, Furong
Huang, Gangliang - Abstract:
- Highlights: The corrosion behavior of PCB-Cu-ImAg under a TEL was studied. The galvanic effect accelerated the corrosion of PCB-Cu-ImAg. The galvanic effect reduced the protective effect of silver-coating. The decrease of TEL thickness increased galvanic current densities at the beginning. The decrease of TEL thickness enhanced the galvanic effect of PCB-Cu-ImAg. Abstract: The corrosion behavior of immersion silver printed circuit board copper (PCB-Cu-ImAg) under a thin electrolyte layer (TEL) was studied by electrochemical tests and surface analysis. The results showed that galvanic effect accelerated the corrosion of PCB-Cu-ImAg and reduced the protective effect of silver-coating. The reduction of TEL thickness not only promoted the corrosion of PCB-Cu-ImAg, but also strengthened the galvanic effect. At the beginning of exposure to TEL, the potential difference decreased, but the galvanic current densities increased with decreasing TEL thickness because of the significant decrease of the total resistance. Because of the continuous formation and accumulation of corrosion products, the galvanic current densities decreased in the later stage of exposure to TEL.
- Is Part Of:
- Engineering failure analysis. Volume 117(2020)
- Journal:
- Engineering failure analysis
- Issue:
- Volume 117(2020)
- Issue Display:
- Volume 117, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 117
- Issue:
- 2020
- Issue Sort Value:
- 2020-0117-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-11
- Subjects:
- PCB-Cu-ImAg -- Corrosion -- Raman spectroscopy -- X-ray photoelectron spectroscopy (XPS)
System failures (Engineering) -- Periodicals
Fracture mechanics -- Periodicals
Reliability (Engineering) -- Periodicals
Pannes -- Périodiques
Rupture, Mécanique de la -- Périodiques
Fiabilité -- Périodiques
Fracture mechanics
Reliability (Engineering)
System failures (Engineering)
Periodicals
Electronic journals
620.112 - Journal URLs:
- http://www.sciencedirect.com/science/journal/13506307 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.engfailanal.2020.104807 ↗
- Languages:
- English
- ISSNs:
- 1350-6307
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 3760.991000
British Library DSC - BLDSS-3PM
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- 21523.xml