Quantification of extreme thermal gradients during in situ transmission electron microscope heating experiments. Issue 4 (13th December 2021)

• Record Type: Journal Article
• Authors: Vijayan, Sriram; Wang, Rongxuan; Kong, Zhenyu; Jinschek, Joerg R.
• Is Part Of: Microscopy research and technique. Volume 85:Issue 4(2022)
• Page Start: 1527
• Page End: 1537
• Publication Date: 2021-12-13
• Subjects: in situ heating -- in situ TEM -- nonequilibrium processes -- thermal gradient -- thermometry; Electron microscopy -- Technique -- Periodicals; Microscopy -- Periodicals; Microscopy -- Technique -- Periodicals; 502.825
• DOI: 10.1002/jemt.24015
• Languages: English
• ISSNs: 1059-910X

Abstract

Abstract: Studies on materials affected by large thermal gradients and rapid thermal cycling are an area of increasing interest, driving the need for real time observations of microstructural evoultion under transient thermal conditions. However, current in situ transmission electron microscope (TEM) heating stages introduce uniform temperature distributions across the material during heating experiments. Here, a methodology is described to generate thermal gradients across a TEM specimen by modifying a commercially available MEMS‐based heating stage. It was found that a specimen placed next to the metallic heater, over a window, cut by FIB milling, does not disrupt the overall thermal stability of the device. Infrared thermal imaging (IRTI) experiments were performed on unmodified and modified heating devices, to measure thermal gradients across the device. The mean temperature measured within the central viewing area of the unmodified device was 3–5% lower than the setpoint temperature. Using IRTI data, at setpoint temperatures ranging from 900 to 1, 300°C, thermal gradients at the edge of the modified window were calculated to be in the range of 0.6 × 10 6 to 7.0 × 10 6 °C/m. Additionally, the Ag nanocube sublimation approach was used, to measure the local temperature across a FIB‐cut Si lamella at high spatial resolution inside the TEM, and demonstrate "proof of concept" of the modified MEMS device. The thermal gradient across the Si lamella, measured using the latter approach was found to be 6.3 × 10 6 °C/m, at a setpoint temperature of 1, 000°C. Finally, the applicability of this approach and choice of experimental parameters are critically discussed. Abstract : Thermal gradient (d T /d x ) across a modified MEMS‐based transmission electron microscope (TEM) heating device was measured ex situ using infrared thermography. d T /d x across a Si lamella, measured inside the TEM using Ag nanocube sublimation, was 6.3 × 10 6 °C/m.