On-machine measurement with an electrochemical jet machine tool. (March 2022)

• Record Type: Journal Article
• Authors: Bisterov, Ivan; Abayzeed, Sidahmed; Speidel, Alistair; Clare, Adam T.
• Is Part Of: International journal of machine tools & manufacture. Volume 174(2022)
• Publication Date: 2022-03
• Subjects: Electrolyte jet machining -- Electrochemical machining -- On-machine measurement; Machine-tools -- Periodicals; Manufacturing processes -- Periodicals; Machines-outils -- Périodiques; Fabrication -- Périodiques; Electronic journals; 621.902
• DOI: 10.1016/j.ijmachtools.2022.103859
• Languages: English
• ISSNs: 0890-6955

Abstract

Abstract: Measurement of surface geometry is an essential activity in engineering, which is commonly performed by tracing the surface of interest with a mechanical or an optical probe. This is generally performed ex-situ in laboratories designed for metrology. However, inline measurement represents an opportunity to unlock significant efficiency gains throughout manufacturing. Here, a new approach is proposed for in-situ measurement of surface topography using an electrolyte jet as a scanning probe within a precision electrochemical jet machine tool. The electrical resistance of a cylindrical jet impinging on a metal surface is a direct measure of the distance between the surface and the electrified nozzle, allowing profiling of surface shape. This enables integrated on-machine measurement in the electrochemical jet apparatus with tuneable sensitivity and vertical resolution, achieving accuracy of 4.4% with the calibration proposed here. The developed measurement system provides an accurate and low-cost surface imaging approach that can be easily integrated with industrial manufacturing processes. Graphical abstract: Image 1 Highlights: An electrolyte jet can be used as a probe for measurement of surface geometry. The resistance of the impinging jet is dependent on the distance to the surface. Accurate on-machine measurement within electrolyte jet machining is demonstrated. Micrometric vertical resolution is achievable.