Optimal design and reliability analysis of a compliant stroke amplification mechanism. (May 2022)

• Record Type: Journal Article
• Authors: Guo, Fanyi; Sun, Zhili; Zhang, Shengnan; Cao, Runan; Li, Haiyang
• Is Part Of: Mechanism and machine theory. Volume 171(2022)
• Publication Date: 2022-05
• Subjects: Compliant mechanism -- Displacement amplification ratio -- Manufacturing error -- Reliability; Machine theory -- Periodicals; Machinery -- Periodicals; Machines -- Périodiques; Génie mécanique -- Périodiques; Machine theory; Machinery; Periodicals; 621.81
• DOI: 10.1016/j.mechmachtheory.2022.104748
• Languages: English
• ISSNs: 0094-114X

Abstract

Highlights: Two optimized compliant stroke amplification mechanisms are introduced. A nonlinear model of compliant stroke amplification mechanism is proposed. The reliability and amplification ratio of two optimized mechanisms are compared. Abstract: This paper proposes two optimized designs of an advanced compliant stroke amplification mechanism (CSAM) with completely distributed compliance. The optimization is performed by improving the dimensions of the CSAM based on linear analytical models. The optimized CSAMs possess approximately 5.6% and 7.8% larger displacement amplification ratios than the original one does. The optimization results are verified through finite element simulations, with less than a 2% difference being observed. To analyze the optimized CSAMs rapidly within relatively large motion ranges, nonlinear analytical models of the optimized CSAMs are also obtained, considering the parameters associated with manufacturing errors and external payloads. The concept of reliability is introduced, and the failure modes of the two optimized CSAMs are defined based on kinematics using the nonlinear analytical models. The sensitivity of the failure probability to manufacture errors at different positions is analyzed. The findings show that the failure probability of the CSAMs is more sensitive to parameters associated with the X-direction coordinates of the output stage and the top endpoint.