Arbuscular mycorrhizal fungi and proximal sensing for improving nutrient use efficiencies in wheat (Triticum aestivum L.). (28th May 2022)

• Record Type: Journal Article
• Authors: Varinderpal-Singh, ; Kunal, ; Gosal, Satwant Kaur; Choudhary, Rita; Singh, Reena; Adholeya, Alok
• Is Part Of: Journal of plant nutrition. Volume 45:Number 9(2022)
• Page Start: 1291
• Page End: 1304
• Publication Date: 2022-05-28
• Subjects: Mycorrhiza -- nitrogen -- phosphorus -- precision management; Plants -- Nutrition -- Periodicals; Plants -- Effect of minerals on -- Periodicals; Deficiency diseases in plants -- Periodicals; 575.76
• DOI: 10.1080/01904167.2021.2014872
• Languages: English
• ISSNs: 0190-4167

Abstract

Abstract: A 4 years field study was conducted to improve nitrogen (N) and phosphorus (P) use efficiencies in wheat ( Triticum aestivum L.) using arbuscular mycorrhizal fungi (AMF) and precision N management. Split plot design was employed to rationalize N and P fertilizer use in two different experiments with AMF in the main plot and fertilizer application practice in the subplots. The AMF seed coating improved mycorrhization, root dry weight and P uptake. AMF coating of wheat seeds improved mean grain yield and agronomic efficiency of applied P fertilizer (AEP ) by 11% and 55.4%, respectively. However, AMF seed coating did not improve chlorophyll content, normalized difference vegetative index, grain yield and agronomic efficiency of applied N fertilizer (AEN ). Precision N management using leaf color chart (LCC), chlorophyll meter (SPAD), and GreenSeeker optical sensor (GS) sustained wheat grain yield equivalent to the soil-test based N fertilizer recommendation with 20–31 kg ha −1 less fertilizer N. Proximal sensing guided N use improved AEN by 21.9%–39.6% while mitigating global warming potential by 16%–24%. Integrated use of AMF seed coating and precision N management provides a potential solution to improve N and P nutrition and reduce environmental footprints of fertilizer N use in wheat.