Experimental and theoretical research on creep‐fatigue behaviors of 316L steel with and without 650°C thermal aging. Issue 4 (18th January 2022)

• Record Type: Journal Article
• Authors: Mao, Jianfeng; Yang, Jiadong; Zhu, Jian; Ding, Zhenyu; Zhong, Fengping; Wang, Dasheng
• Is Part Of: Fatigue & fracture of engineering materials & structures. Volume 45:Issue 4(2022)
• Page Start: 1179
• Page End: 1198
• Publication Date: 2022-01-18
• Subjects: 316L steel -- creep‐fatigue -- life prediction -- microstructure -- thermal aging; Materials -- Fatigue -- Periodicals; Fracture mechanics -- Periodicals; 620.1123
• DOI: 10.1111/ffe.13657
• Languages: English
• ISSNs: 8756-758X

Abstract

Abstract: In this paper, tensile test and creep‐fatigue test at 650°C were carried out for 316L steel with and without prior thermal aging. The effect of aging on creep‐fatigue interaction of 316L steel is analyzed in detail. Microscopic observations are performed on fatigue and creep‐fatigue specimens to study the microstructure characteristics affected by aging, creep, and fatigue. Actually, three strain amplitude loadings of ±0.3%, ±0.4%, and ±0.5% are adopted in creep‐fatigue tests. The creep‐fatigue behaviors of unaged and aged 316L steel are investigated in depth for varying strain amplitude. The creep‐fatigue constitutive model is constructed by using Chaboche mixed softening and hardening model combined with strain hardening creep. Life prediction models are compared and used to do prediction. The applicability of different models is recommended. The accuracy of the models is analyzed by comparing with the test data. The agreement is achieved between theoretical and experimental predictions. Highlights: Influences of thermal aging on creep‐fatigue behaviors of 316L steel are investigated. The creep‐fatigue behaviors are characterized with cyclic stress–strain response curve. Microstructural observations are performed to identify the failure mechanism. Life prediction is compared between theoretical and test data with various models.