Economic quality design under model uncertainty in micro-drilling manufacturing process. Issue 3 (1st February 2022)

• Record Type: Journal Article
• Authors: Han, Yunxia; Tu, Yiliu; Ouyang, Linhan; Wang, Jianjun; Ma, Yizhong
• Is Part Of: International journal of production research. Volume 60:Issue 3(2022)
• Page Start: 1086
• Page End: 1104
• Publication Date: 2022-02-01
• Subjects: Parameter design -- tolerance design -- quality loss function -- inspection cost -- model uncertainty; Factory management -- Periodicals; 658.57
• DOI: 10.1080/00207543.2020.1851792
• Languages: English
• ISSNs: 0020-7543

Abstract

Abstract : Integrated parameter design and tolerance design (IPTD) is an effective way to improve product quality and reduce manufacturing cost in micro-manufacturing processes. However, the current modeling techniques rarely analyze the influence of model uncertainty on the optimal machining parameters. It may not obtain the robust optimal machining parameters due to model uncertainty. This paper proposes a novel economically integrated design method which considers the correlations among quality characteristics, the variability of manufacturing process, and uncertainty in the model predictions. First, a new rework and scrap cost functions are established via Monte Carlo simulation. Meanwhile, an integrative expected quality loss function is constructed based on interval analysis theory for quantifying model uncertainty. Second, to make the proposed method closer to the practical micro-manufacturing problem, we consider the trade-offs among cost, time, and success rate in the modeling process. Finally, a total cost model is proposed to take into account the quality loss, tolerance cost, unit manufacturing cost, and scrap cost. The effectiveness of the proposed modeling method is verified by a laser beam micro-drilling manufacturing. The results illustrate that the proposed method can achieve better robustness property and economically than the traditional method that does not consider model uncertainty.