Review—Silicon Nitride and Silicon Nitride-Rich Thin Film Technologies: State-of-the-Art Processing Technologies, Properties, and Applications. (7th August 2020)
- Record Type:
- Journal Article
- Title:
- Review—Silicon Nitride and Silicon Nitride-Rich Thin Film Technologies: State-of-the-Art Processing Technologies, Properties, and Applications. (7th August 2020)
- Main Title:
- Review—Silicon Nitride and Silicon Nitride-Rich Thin Film Technologies: State-of-the-Art Processing Technologies, Properties, and Applications
- Authors:
- Kaloyeros, Alain E.
Pan, Youlin
Goff, Jonathan
Arkles, Barry - Abstract:
- Abstract : Accelerating interest in silicon nitride thin film material system continues in both academic and industrial communities due to its highly desirable physical, chemical, and electrical properties and the potential to enable new device technologies. As considered here, the silicon nitride material system encompasses both non-hydrogenated (SiNx ) and hydrogenated (SiNx :H) silicon nitride, as well as silicon nitride-rich films, defined as SiNx with C inclusion, in both non-hydrogenated (SiNx (C)) and hydrogenated (SiNx :H(C)) forms. Due to the extremely high level of interest in these materials, this article is intended as a follow-up to the authors' earlier publication [A. E. Kaloyeros, F. A. Jové, J. Goff, B. Arkles, Silicon nitride and silicon nitride-rich thin film technologies: trends in deposition techniques and related applications, ECS J. Solid State Sci. Technol., 6, 691 (2017)] that summarized silicon nitride research and development (R&D) trends through the end of 2016. In this survey, emphasis is placed on cutting-edge achievements and innovations from 2017 through 2019 in Si and N source chemistries, vapor phase growth processes, film properties, and emerging applications, particularly in heterodevice areas including sensors, biointerfaces and photonics.
- Is Part Of:
- ECS journal of solid state science and technology. Volume 9:Number 6(2020)
- Journal:
- ECS journal of solid state science and technology
- Issue:
- Volume 9:Number 6(2020)
- Issue Display:
- Volume 9, Issue 6 (2020)
- Year:
- 2020
- Volume:
- 9
- Issue:
- 6
- Issue Sort Value:
- 2020-0009-0006-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-08-07
- Subjects:
- silicon nitride -- Thin film growth -- Atomic layer deposition -- Chemical Vapor Deposition -- Metal Organic Chemical Vapor deposition -- Dielectrics -- PECVD
Solid state chemistry -- Periodicals
Electronics -- Materials -- Periodicals
Electrochemistry -- Periodicals
541.0421 - Journal URLs:
- https://iopscience.iop.org/journal/2162-8777 ↗
http://www.electrochem.org/ ↗ - DOI:
- 10.1149/2162-8777/aba447 ↗
- Languages:
- English
- ISSNs:
- 2162-8777
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 20922.xml