Cite
HARVARD Citation
Dewi, R. et al. (2020). Analysis of Ferroelectric Thin Film BaZr0.6Ti0.4O3 with Annealing Temperature Increase Variations Using x-ray Diffraction. Journal of physics. p. . [Online].
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Dewi, R. et al. (2020). Analysis of Ferroelectric Thin Film BaZr0.6Ti0.4O3 with Annealing Temperature Increase Variations Using x-ray Diffraction. Journal of physics. p. . [Online].