Identification of nanometer-scale compositional fluctuations in silicate glass using electron microscopy and spectroscopy. (September 2018)

• Record Type: Journal Article
• Authors: Nakazawa, Katsuaki; Miyata, Tomohiro; Amma, Shin-ichi; Mizoguchi, Teruyasu
• Is Part Of: Scripta materialia. Number 154(2018)
• Page Start: 197
• Page End: 201
• Publication Date: 2018-09
• Subjects: Silica glass -- Electron microscopy -- Phase separation -- Spinodal-type; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2018.05.048
• Languages: English
• ISSNs: 1359-6462

Abstract

Abstract: Silicate glasses are indispensable for optical and photonics applications, and their properties are affected by phase-separated structures. Understanding the phase separation behavior inside the glasses is thus crucial for controlling their optical properties. Here, we attempt to identify the phase-separated structure inside silicate glass by high-angular annular dark field-scanning transmission electron microscopy (HAADF-STEM) combined with a multi-slice image simulation. In addition to the phase-separated structure, we also demonstrate that the identifications of the type and stage of the phase-separation are possible by the HAADF observation in combination with a phase separation simulation. Graphical abstract: Unlabelled Image