Corrosion properties of phase reversion induced nano/ultrafine grained AISI 304 metastable austenite stainless steel. (November 2018)

• Record Type: Journal Article
• Authors: Lv, Yang; Luo, Hongyun; Tang, Jun; Guo, Jingjing; Pi, Jinliang; Ye, Kanglin
• Is Part Of: Materials research bulletin. Volume 107(2018)
• Page Start: 421
• Page End: 429
• Publication Date: 2018-11
• Subjects: 304 Austenite stainless steel -- Reverted martensite-austenitic transformation -- Passive film -- Corrosion resistance -- Cryogenic temperature; Materials -- Periodicals; Crystal growth -- Periodicals; Matériaux -- Périodiques; Cristaux -- Croissance -- Périodiques; Crystal growth; Materials; Periodicals; 620.11
• DOI: 10.1016/j.materresbull.2018.04.024
• Languages: English
• ISSNs: 0025-5408

Abstract

Graphical abstract: Highlights: AISI 304 stainless steel was cold rolled under 3 cryogenic temperatures and room temperature, after annealing bulk nano/ultrafine grained material was obtained. Microstructure of samples was studied by TEM, −120 °C rolled sample had an equiaxed microstructure. Corrosion resistance of samples was studied by polarization curve, EIS, and Mott-Schottky plot, −120 °C rolled sample had the best corrosion performance. The distinctive polarization curve of −120 °C rolled sample indicated its passive film had peculiar feature, the M-S plot showed its abnormal semiconductor character. Abstract: AISI 304 metastable austenite stainless steel was cold rolled under cryogenic temperature and transformed into martensite completely, after reverse transformation by annealing, bulk nano/ultrafine grained material was obtained. The material's microstructure was observed by TEM, and the corrosion resistance was studied by polarization curve, EIS, and Mott-Schottky plot. Results showed that samples cold rolled at −120 °C had an equiaxed microstructure and displayed the best corrosion performance. The distinctive polarization curve shape indicated that its passive film had a peculiar feature, and the M-S plot showed its abnormal semiconductor character. XPS measurements are used to directly characterize the composition of passive film formed on specimens. Heterogeneous microstructures might help with the improvement on corrosion resistance of the nano/ultrafine grained stainless steel.