A Semi‐supervised Classification Method of Parasites Using Contrastive Learning. Issue 3 (23rd November 2021)

• Record Type: Journal Article
• Authors: Ren, Yanni; Jiang, Hao; Zhu, Huilin; Tian, Yanling; Hu, Jinglu
• Is Part Of: IEEJ transactions on electrical and electronic engineering. Volume 17:Issue 3(2022)
• Page Start: 445
• Page End: 453
• Publication Date: 2021-11-23
• Subjects: parasite recognition -- semi‐supervised learning -- contrastive learning -- Laplacian SVM -- quasi‐linear kernel; Electrical engineering -- Periodicals; Electronics -- Periodicals; 621.3
• DOI: 10.1002/tee.23525
• Languages: English
• ISSNs: 1931-4973

Abstract

Abstract : An expected shortfall of supervised learning for medical imaging classification is the insatiable need for human annotation, which is very expensive. Further, for microscopic parasite images, the salient structures are generally fuzzy, and the insignificant textures are noising. This paper proposes a semi‐supervised classification method of three parasites and Erythrocytes microscopic images using a large amount of unlabeled data and a small amount of labeled data for training. It contains a feature extractor trained by contrastive learning and a classifier optimized by Laplacian Support Vector Machine (LapSVM). First, for the deep Convolutional Neural Network feature extractor, we introduce real‐world images with similar and clear semantic information to enhance the structure at the representation level. In addition, we introduce variant appearance transformations to eliminate the texture at the representation level. Second, the gated linear network is adopted as the classifier to realize a piecewise linear separation boundary. The parameters are optimized implicitly by LapSVM using a kernel function composed of the representation and the gate control signals, which are generated from the learned feature extractor. The proposed method shows excellent performance when only 1% of the microscopic images are labeled. As a result, we achieve affordable and accurate diagnostic testing in parasite classification. © 2021 Institute of Electrical Engineers of Japan. Published by Wiley Periodicals LLC.