Cite
HARVARD Citation
Cruz, J. et al. (2022). Accuracy of a reference-free Monte Carlo approach for SEM-EDS thickness assessment of TiN coatings onto diverse substrates. Micron. p. . [Online].
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Cruz, J. et al. (2022). Accuracy of a reference-free Monte Carlo approach for SEM-EDS thickness assessment of TiN coatings onto diverse substrates. Micron. p. . [Online].