Botnet attack detection in Internet of Things devices over cloud environment via machine learning. (13th October 2021)

• Record Type: Journal Article
• Authors: Waqas, Muhammad; Kumar, Kamlesh; Laghari, Asif Ali; Saeed, Umair; Rind, Muhammad Malook; Shaikh, Aftab Ahmed; Hussain, Fahad; Rai, Athaul; Qazi, Abdul Qayoom
• Is Part Of: Concurrency and computation. Volume 34:Number 4(2022)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2021-10-13
• Subjects: botnet attacks -- botnet intrusion detection system -- Cloud of Things -- Internet of Things -- machine learning; Parallel processing (Electronic computers) -- Periodicals; Parallel computers -- Periodicals; 004.35
• DOI: 10.1002/cpe.6662
• Languages: English
• ISSNs: 1532-0626

Abstract

Summary: With the arrival of the Internet of Things (IoT) many devices such as sensors, nowadays can communicate with each other and share data easily. However, the IoT paradigm is prone to security concerns as many attackers try to hit the network and make it vulnerable. In this scenario, security concerns are the most important and to address them various models have been designed to overcome these security issues, but still there exist many emerging variants of botnet attacks such as Mirai, Persirai, and Bashlite that exploits the security breaches. This research article aims to investigate cyber security in the advent of B‐IDS, DDOS, and malware attacks. For this purpose, different machine learning algorithms, namely, support vector machine, naive Bayes, linear regression, artificial neural network, decision tree, random forest, the fuzzy classifier, K‐nearest neighbor, adaptive boosting, gradient boosting, and tree ensemble have been implemented for botnet attack detection. For performance measures, these algorithms have been tested on nine sensor devices over N‐BaIoT datasets to measure the security and accuracy of the intrusion detection system. The results show that the tree‐based algorithm achieved more than 99% accuracy which is quite higher as compared to other tested methods on the same sensor devices.