Process and device simulations aimed at improving the emitter region performance of silicon PERC solar cells. (21st December 2021)
- Record Type:
- Journal Article
- Title:
- Process and device simulations aimed at improving the emitter region performance of silicon PERC solar cells. (21st December 2021)
- Main Title:
- Process and device simulations aimed at improving the emitter region performance of silicon PERC solar cells
- Authors:
- Kashyap, Savita
Madan, Jaya
Pandey, Rahul
Sharma, Rajnish - Abstract:
- Abstract: Achieved levels of silicon-based passivated emitter and rear cell (PERC) solar cells laboratory and module-level conversion efficiencies are still far from the theoretically achievable Auger limit of 29.4% for silicon solar cells, prominently due to emitter recombination and resistive losses. The emitter region in PERC devices is formed by using either ion implantation followed by a diffusion process or POCl3 diffusion. In ion-implanted emitter-based PERC, the process variables such as dose, energy, diffusion time, and temperature play a vital role in defining the characteristics of the emitter region. Detailed investigation of these parameters could provide a pathway to mitigate the recombination as well as resistive losses; however, it requires a considerable budget to optimize these parameters through a purely experimental approach. Therefore, advanced industrial standard process and device simulation are perceived in this work to carry out the comprehensive study of process variables. Investigation of ion implantation and diffusion process parameters on the PV performance of an upright pyramid textured, industrial standard stacked dielectric passivated PERC solar cell is carried out to deliver 22.8% conversion efficiency with improved PV parameters such as short circuit current density ( J SC ) of 40.8 mA cm −2, open-circuit voltage ( V OC ) of 686 mV, and fill-factor (FF) of 81.54% at optimized implantation and diffusion parameters, such as implantation doseAbstract: Achieved levels of silicon-based passivated emitter and rear cell (PERC) solar cells laboratory and module-level conversion efficiencies are still far from the theoretically achievable Auger limit of 29.4% for silicon solar cells, prominently due to emitter recombination and resistive losses. The emitter region in PERC devices is formed by using either ion implantation followed by a diffusion process or POCl3 diffusion. In ion-implanted emitter-based PERC, the process variables such as dose, energy, diffusion time, and temperature play a vital role in defining the characteristics of the emitter region. Detailed investigation of these parameters could provide a pathway to mitigate the recombination as well as resistive losses; however, it requires a considerable budget to optimize these parameters through a purely experimental approach. Therefore, advanced industrial standard process and device simulation are perceived in this work to carry out the comprehensive study of process variables. Investigation of ion implantation and diffusion process parameters on the PV performance of an upright pyramid textured, industrial standard stacked dielectric passivated PERC solar cell is carried out to deliver 22.8% conversion efficiency with improved PV parameters such as short circuit current density ( J SC ) of 40.8 mA cm −2, open-circuit voltage ( V OC ) of 686 mV, and fill-factor (FF) of 81.54% at optimized implantation and diffusion parameters, such as implantation dose of 5 × 10 15 cm −2 with energy 30 keV followed 950 °C diffusion temperature and 30 min of diffusion time. The performance of the optimized PERC device is compared with already published large area screen printed contact-based device. This work may open up a window for the experimental work to understand the influence of process parameters on the emitter region to develop the highly efficient PERC solar cell in the future. … (more)
- Is Part Of:
- Journal of micromechanics and microengineering. Volume 32:Number 2(2022)
- Journal:
- Journal of micromechanics and microengineering
- Issue:
- Volume 32:Number 2(2022)
- Issue Display:
- Volume 32, Issue 2 (2022)
- Year:
- 2022
- Volume:
- 32
- Issue:
- 2
- Issue Sort Value:
- 2022-0032-0002-0000
- Page Start:
- Page End:
- Publication Date:
- 2021-12-21
- Subjects:
- emitter profile -- ion-implantation -- diffusion temperature -- dopant activation -- passivation -- PERC solar cell
Microelectromechanical systems -- Periodicals
Micromechanics -- Periodicals
621.38105 - Journal URLs:
- http://iopscience.iop.org/0960-1317 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1361-6439/ac404b ↗
- Languages:
- English
- ISSNs:
- 0960-1317
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
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