Twice-Modulated Light in Fourier Transform Infrared (FT-IR) Spectrometers from Reflective Samples: Avoiding Distorted Intensity Values. Issue 5 (May 2022)

• Record Type: Journal Article
• Authors: Johnson, Timothy J.; Baker, Tracy J.; Bradley, Ashley M.; Yokosuk, Michael O.; Myers, Tanya L.
• Is Part Of: Applied spectroscopy. Volume 76:Issue 5(2022)
• Page Start: 620
• Page End: 624
• Publication Date: 2022-05
• Subjects: Infrared -- IR -- artifact -- Fourier transform infrared -- FT-IR -- reflectance -- double modulation -- retroreflection; Spectrum analysis -- Periodicals; 543.505
• DOI: 10.1177/00037028211066336
• Languages: English
• ISSNs: 0003-7028

Abstract

We document an artifact associated with the back reflection from samples or sampling accessories in Fourier transform spectrometers. Samples oriented normal to the incoming modulated beam can reflect light back to the interferometer and this light (the percentage dependent on the sample's refractive index) is modulated by the interferometer a second time resulting in light erroneously appearing at twice its true frequency. The phenomenon occurs across the spectrum but is most apparent when positive-going narrow absorption peaks at 1 f display as negative-going peaks at 2 f . We have redressed the artifact by implementing a rotation stage directly beneath the sample holder: As the stage is rotated through small angles relative to beam normal, the back-reflected light does not enter the interferometer and the artifact disappears. The observation is relevant to several IR sampling methods: gas/liquid cells, alkali halide pellets, reflectance accessories, etc.