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HARVARD Citation
Choi, S. et al. (2019). Degradation Mechanism of Vanadium Oxide Films When Grown on Y‐Stabilized ZrO2 Above 500 °C. Advanced engineering materials. 21 (12), p. n/a. [Online].
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Choi, S. et al. (2019). Degradation Mechanism of Vanadium Oxide Films When Grown on Y‐Stabilized ZrO2 Above 500 °C. Advanced engineering materials. 21 (12), p. n/a. [Online].