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HARVARD Citation
Morikawa, D. et al. (2021). Evaluation of TEM specimen quality prepared by focused ion beam using symmetry breaking index of convergent-beam electron diffraction. Microscopy. pp. 394-397. [Online].
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Morikawa, D. et al. (2021). Evaluation of TEM specimen quality prepared by focused ion beam using symmetry breaking index of convergent-beam electron diffraction. Microscopy. pp. 394-397. [Online].