Effect of Cationic Interface Defects on Band Alignment and Contact Resistance in Metal/Oxide Heterojunctions. (18th November 2019)
- Record Type:
- Journal Article
- Title:
- Effect of Cationic Interface Defects on Band Alignment and Contact Resistance in Metal/Oxide Heterojunctions. (18th November 2019)
- Main Title:
- Effect of Cationic Interface Defects on Band Alignment and Contact Resistance in Metal/Oxide Heterojunctions
- Authors:
- Andrä, Michael
Funck, Carsten
Raab, Nicolas
Rose, Marc‐André
Vorokhta, Mykhailo
Dvorˇák, Filip
Šmíd, Brˇetislav
Matolín, Vladimír
Mueller, David N.
Dittmann, Regina
Waser, Rainer
Menzel, Stephan
Gunkel, Felix - Abstract:
- Abstract: Heterojunctions between high‐work‐function metals and metal oxides typically lead to Schottky‐type transport barriers resulting from charge transfer between the neighboring materials. These yield versatile electronic functionality exploited for current rectification, memristive behavior, or photocatalysis. Height, width, and shape of the interfacial transport barrier are strongly affected by charge screening via ionic defects, which are often extremely difficult to probe. The ionic nature of a variable contact resistance in heterojunctions between Nb‐doped SrTiO3 (Nb:SrTiO3 ) and platinum is explored. A control of cationic vacancy defects at the interface is achieved by different annealing procedures in oxidizing and reducing conditions before establishing Pt/Nb:SrTiO3 heterojunctions. Detailed analysis of electronic transport across the heterojunctions reveal significantly varied transport barriers resulting from the cationic defect structure at the interface. These findings are supported by conductive‐tip atomic force microscopy and in situ photoemission spectroscopy showing diminished conductivity of the Nb:SrTiO3 surface and the formation of an insulating surface skin layer after oxygenation. At high doping level, oxygen stoichiometry cannot explain the observed behavior. The increased transport barrier height is therefore linked to strontium vacancy defects. The tailored cation disorder yields access to the ionic control of electronic transport in functionalAbstract: Heterojunctions between high‐work‐function metals and metal oxides typically lead to Schottky‐type transport barriers resulting from charge transfer between the neighboring materials. These yield versatile electronic functionality exploited for current rectification, memristive behavior, or photocatalysis. Height, width, and shape of the interfacial transport barrier are strongly affected by charge screening via ionic defects, which are often extremely difficult to probe. The ionic nature of a variable contact resistance in heterojunctions between Nb‐doped SrTiO3 (Nb:SrTiO3 ) and platinum is explored. A control of cationic vacancy defects at the interface is achieved by different annealing procedures in oxidizing and reducing conditions before establishing Pt/Nb:SrTiO3 heterojunctions. Detailed analysis of electronic transport across the heterojunctions reveal significantly varied transport barriers resulting from the cationic defect structure at the interface. These findings are supported by conductive‐tip atomic force microscopy and in situ photoemission spectroscopy showing diminished conductivity of the Nb:SrTiO3 surface and the formation of an insulating surface skin layer after oxygenation. At high doping level, oxygen stoichiometry cannot explain the observed behavior. The increased transport barrier height is therefore linked to strontium vacancy defects. The tailored cation disorder yields access to the ionic control of electronic transport in functional oxide heterojunctions. Abstract : Ionic defects play an essential role in the screening of interfacial charges in complex oxides. The influence of cation vacancy defects on the charge screening in Pt/Nb:SrTiO3 heterjunctions serving as model systems for metal/metal‐oxide interface devices is demonstrated. The ability to tune the concentration of cationic defects at the interface allows to tailor the transport barrier at the interface. … (more)
- Is Part Of:
- Advanced Electronic Materials. Volume 6:Number 1(2020)
- Journal:
- Advanced Electronic Materials
- Issue:
- Volume 6:Number 1(2020)
- Issue Display:
- Volume 6, Issue 1 (2020)
- Year:
- 2020
- Volume:
- 6
- Issue:
- 1
- Issue Sort Value:
- 2020-0006-0001-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2019-11-18
- Subjects:
- band engineering -- defect formation -- ionic charge screening -- metal/metal‐oxide heterojunctions -- oxide interfaces
Materials -- Electric properties -- Periodicals
Materials science -- Periodicals
Magnetic materials -- Periodicals
Electronic apparatus and appliances -- Periodicals
537 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)2199-160X ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/aelm.201900808 ↗
- Languages:
- English
- ISSNs:
- 2199-160X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.848400
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 20512.xml