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HARVARD Citation
Lin, Y. et al. (2022). Investigating two-stage degradation of threshold voltage induced by off-state stress in AlGaN/GaN HEMTs. Semiconductor science and technology. p. . [Online].
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Lin, Y. et al. (2022). Investigating two-stage degradation of threshold voltage induced by off-state stress in AlGaN/GaN HEMTs. Semiconductor science and technology. p. . [Online].