A comprehensive static modeling methodology via beam theory for compliant mechanisms. (March 2022)

• Record Type: Journal Article
• Authors: Wu, Ke; Zheng, Gang
• Is Part Of: Mechanism and machine theory. Volume 169(2022)
• Publication Date: 2022-03
• Subjects: Compliant mechanisms -- General planar beams -- Euler–Bernoulli beam theory -- Nonlinear static modeling -- Ordinary differential equation (ODE) -- Boundary value problem (BVP) -- Numerical methods; Machine theory -- Periodicals; Machinery -- Periodicals; Machines -- Périodiques; Génie mécanique -- Périodiques; Machine theory; Machinery; Periodicals; 621.81
• DOI: 10.1016/j.mechmachtheory.2021.104598
• Languages: English
• ISSNs: 0094-114X

Abstract

Abstract: Compliant Mechanisms (CMs) present several desired properties for mechanical applications only depending on elastic deformation of the involved compliant beams/flexures. As reported in the current literature, most CM designs utilize straight beams and initially curved beams (ICBs) as the fundamental flexible members. In CM research community, many great contributions regarding modeling these elementary flexible members have been achieved. In this paper, a comprehensive modeling methodology, based on beam theory, has been established to characterize the static planar deflection of slender beam. Then such a methodology has been applied to solve 8 loading scenarios of large beam-deflection problems that exist in the design of CMs. Essentially speaking, all these beam-deflection problems are treated as a type of boundary value problems (BVPs) of an ordinary differential equation (ODE) and solved by a modified collocation method. After that, this methodology has been used to model some representative CMs with large-deflection strokes, such as compliant parallelograms. Highlights: We presented a comprehensive modeling strategy for beams and CMs. We proposed a modified collocation method. We applied the proposed method to solve 8 beam-deflection problems. We modeled four representative large-deflection CMs via the proposed method.