Entropy Fit Indices: New Fit Measures for Assessing the Structure and Dimensionality of Multiple Latent Variables. (2nd November 2021)

• Record Type: Journal Article
• Authors: Golino, Hudson; Moulder, Robert; Shi, Dingjing; Christensen, Alexander P.; Garrido, Luis Eduardo; Nieto, Maria Dolores; Nesselroade, John; Sadana, Ritu; Thiyagarajan, Jotheeswaran Amuthavalli; Boker, Steven M.
• Is Part Of: Multivariate behavioral research. Volume 56:Number 6(2021)
• Page Start: 874
• Page End: 902
• Publication Date: 2021-11-02
• Subjects: Fit measures -- dimensionality analysis -- information theory -- network psychometrics -- exploratory graph analysis; Psychometrics -- Periodicals; Psychology, Experimental -- Periodicals; Psychology, Experimental; Psychometrics; Periodicals; 150.15195
• DOI: 10.1080/00273171.2020.1779642
• Languages: English
• ISSNs: 0027-3171

Abstract

Abstract: The accurate identification of the content and number of latent factors underlying multivariate data is an important endeavor in many areas of Psychology and related fields. Recently, a new dimensionality assessment technique based on network psychometrics was proposed (Exploratory Graph Analysis, EGA), but a measure to check the fit of the dimensionality structure to the data estimated via EGA is still lacking. Although traditional factor-analytic fit measures are widespread, recent research has identified limitations for their effectiveness in categorical variables. Here, we propose three new fit measures (termed entropy fit indices) that combines information theory, quantum information theory and structural analysis: Entropy Fit Index (EFI), EFI with Von Neumman Entropy (EFI.vn) and Total EFI.vn (TEFI.vn). The first can be estimated in complete datasets using Shannon entropy, while EFI.vn and TEFI.vn can be estimated in correlation matrices using quantum information metrics. We show, through several simulations, that TEFI.vn, EFI.vn and EFI are as accurate or more accurate than traditional fit measures when identifying the number of simulated latent factors. However, in conditions where more factors are extracted than the number of factors simulated, only TEFI.vn presents a very high accuracy. In addition, we provide an applied example that demonstrates how the new fit measures can be used with a real-world dataset, using exploratory graph analysis.