Deep learning based defect inspetion in TFT-LCD rib depth detection. (December 2021)

• Record Type: Journal Article
• Authors: Ho, Chao-Ching; Wang, Hao-Ping; Chiao, Yuan-Cheng
• Is Part Of: Measurement. Volume 18(2021)
• Publication Date: 2021-12
• Subjects: Flaw detection -- Feature detection -- Automatic optical detection -- Digital image processing -- Convolutional neural network -- Model acceleration; Detectors -- Periodicals; Measurement -- Periodicals; 530.7
• DOI: 10.1016/j.measen.2021.100198
• Languages: English
• ISSNs: 2665-9174

Abstract

Abstract: In this research, a set of TFT-LCD rib mark depth detection system was proposed. The system is mainly divided into three parts: hardware, system control and software. For the hardware part, a line scan camera coupled with a telecentric coaxial lense were adopted for shooting. As for the light source, an internal coaxial white light source combined with a white line light source were employed to strengthen characteristic information. For the system control part, Nivdia Xavier AGX was applied. The model weighted data format was changed to INT8 to accelerate the model image prediction speed and shorten the time to 0.18 seconds. For the software part, in order to detect rib mark features, the Unet network was mainly used to carry out feature segmentation, with splitting accuracy reaching 100%.