Flexible Metal‐Organic Framework for Mechanical Sub Tbyte inch−2 Data Recording under Ambient Condition (Adv. Mater. Interfaces 22/2021). Issue 22 (23rd November 2021)

• Record Type: Journal Article
• Authors: Alekseevskiy, P. V.; Rzhevskiy, S.; Gilemkhanova, V.; Kulachenkov, N. K.; Sapianik, A.; Barsukova, M.; Fedin, V. P.; Milichko, V. A.
• Is Part Of: Advanced materials interfaces. Volume 8:Issue 22(2021)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2021-11-23
• Subjects: 2D materials -- chemical etching -- data storage -- metal‐organic frameworks -- scanning probe lithography; Materials science -- Periodicals; 620.11
• DOI: 10.1002/admi.202170131
• Languages: English
• ISSNs: 2196-7350

Abstract

Abstract : "Read‐only‐Memory" Based on Metal Organic Frameworks In article number 2101196, P. V. Alekseevskiy, V. A. Milichko, and co‐workers report the mechanical recording and reading the nanometer‐scale patterns onto flexible 2D metal organic framework (MOF) at ambient conditions. Treatment of the MOF surface with a hot solvent decreases the roughness up to 1/7 of the layer thickness. Therefore, an atomic force microscope probe is allowed to cause the deformations with the spatial resolution up to 25 nm (≈0.1 Tbyte inch −2 storage density) and the depth from 0.4 nm.