Cite
HARVARD Citation
Shao, Y. et al. (n.d.). Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM. Microscopy and microanalysis. pp. 1938-1939. [Online].
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Shao, Y. et al. (n.d.). Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM. Microscopy and microanalysis. pp. 1938-1939. [Online].