Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium. (August 2019) - Niculae, Adrian; Barros, Thiago; Bechteler, Alois; Hermenau, Kathrin; Heinzinger, Klaus; Liebel, Andreas; Soltau, Heike; Strüder, Lothar