Cite
HARVARD Citation
Zhang, D. et al. (n.d.). Advancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from "Impossible" to "Routine". Microscopy and microanalysis. pp. 1676-1677. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Zhang, D. et al. (n.d.). Advancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from "Impossible" to "Routine". Microscopy and microanalysis. pp. 1676-1677. [Online].