Cite
HARVARD Citation
Trimby, P. et al. (n.d.). The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity. Microscopy and microanalysis. pp. 2394-2395. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Trimby, P. et al. (n.d.). The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity. Microscopy and microanalysis. pp. 2394-2395. [Online].