Cite
HARVARD Citation
Conroy, M. et al. (n.d.). Investigating Ferroelectric Domain and Domain Wall Dynamics at Atomic Resolution by TEM/STEM in situ Heating and Biasing. Microscopy and microanalysis. pp. 1882-1883. [Online].
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Conroy, M. et al. (n.d.). Investigating Ferroelectric Domain and Domain Wall Dynamics at Atomic Resolution by TEM/STEM in situ Heating and Biasing. Microscopy and microanalysis. pp. 1882-1883. [Online].