Cite
HARVARD Citation
Han, E. et al. (n.d.). Probing The Mechanical Properties of Few-Layer Graphene with Aberration-Corrected, Low-Voltage STEM. Microscopy and microanalysis. pp. 1730-1731. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Han, E. et al. (n.d.). Probing The Mechanical Properties of Few-Layer Graphene with Aberration-Corrected, Low-Voltage STEM. Microscopy and microanalysis. pp. 1730-1731. [Online].