High spectral resolution EELS to probe optics at the nanometer scale. (August 2019) - Tizei, Luiz H. G.; Saito, Hikaru; Lourenço-Martins, Hugo; Tencé, Marcel; Blazit, Jean-Denis; Li, Xiaoyan; Zobelli, Alberto; Bocher, Laura; Gloter, Alexandre; Stéphan, Odile; Kociak, Mathieu