News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy. (August 2019) - Niculae, Adrian; Barros, Thiago; Bechteler, Alois; Lackner, Robert; Hermenau, Kathrin; Heizinger, Klaus; Mönninghoff, Tristan; Soltau, Heike; Strüder, Lothar