Cite
HARVARD Citation
Gerlach, M. et al. (2021). Influence of different test strategies on the power cycling test results of 6.5 kV SiC MOSFETs. Microelectronics and reliability. p. . [Online].
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Gerlach, M. et al. (2021). Influence of different test strategies on the power cycling test results of 6.5 kV SiC MOSFETs. Microelectronics and reliability. p. . [Online].