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HARVARD Citation
Yin, J. et al. (2021). A method to improve the accuracy and efficiency for metallized-film capacitor's reliability assessment using joint simulation. Microelectronics and reliability. p. . [Online].
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Yin, J. et al. (2021). A method to improve the accuracy and efficiency for metallized-film capacitor's reliability assessment using joint simulation. Microelectronics and reliability. p. . [Online].