Cite
HARVARD Citation
Wang, J. et al. (2021). Study on the high-temperature triggering and holding characteristics of PDSOI SCR devices. Microelectronics and reliability. p. . [Online].
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Wang, J. et al. (2021). Study on the high-temperature triggering and holding characteristics of PDSOI SCR devices. Microelectronics and reliability. p. . [Online].