Cite
HARVARD Citation
Gao, Z. et al. (2021). Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN HEMTs during step stress. Microelectronics and reliability. p. . [Online].
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Gao, Z. et al. (2021). Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN HEMTs during step stress. Microelectronics and reliability. p. . [Online].